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SVDV is a configuration used in ICP-OES instruments that enhances the analytical capabilities of the technique. In traditional ICP-OES, the sample is aspirated and atomized within the inductively coupled plasma, and the emitted light is collected by a single optical path and passed through a single optical grating system to measure the emitted spectra.
SVDV introduces two simultaneous views (axial and radial) of the plasma emission, which provides distinct advantages: Axial view is optimized for the detection of low concentration elements and trace metals, providing a longer path length for the emitted light, increasing sensitivity for trace analysis and Radial view which measures high concentration elements and major components. It provides higher spectral resolution and lower background noise for elements that emit strong signals. SVDV-ICP-OES is a technique used for the detection of elements at trace (parts of million) levels in numerous sample types, which provides a highly reliable technique due to good stability, limited spectral interferences and low matrix effects.
AAS and AES are techniques used for the detection of elements at trace levels in numerous material types by quantifying the concentration of specific elements in a sample, achieved by measuring the absorption of light at characteristic wavelengths. This technique is reliable, producing accurate results efficiently and quickly. RSSL offers several variations of the AAS technique (flame, graphite, hydride), which further broadens the analytical capabilities.